Aberration-corrected Analytical Electron Microscopy - download pdf or read online

By Rik Brydson

ISBN-10: 0470518510

ISBN-13: 9780470518519

The e-book is anxious with the speculation, heritage, and sensible use of transmission electron microscopes with lens correctors which may right the consequences of round aberration. The publication additionally covers a comparability with aberration correction within the TEM and functions of analytical aberration corrected STEM in fabrics technology and biology. This e-book is key for microscopists curious about nanoscale and fabrics microanalysis specifically these utilizing scanning transmission electron microscopy, and comparable analytical options equivalent to electron diffraction x-ray spectrometry (EDXS) and electron power loss spectroscopy (EELS).

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4. , 2001). Of particular interest to users of aberration-corrected instruments is high-angle annular dark field (HAADF) imaging. High-angle in this context signifies several tens of mrad, which is beyond the angle at which diffraction maxima (spots) of any significant intensity are found. High-angle scattered electrons are few in number, and mostly result from Rutherford scattering. 7. A HAADF image, collected from electrons scattered in the angular range GENERAL INTRODUCTION-TRANSMISSION ELECTRON MICROSCOPY 11 perhaps 50 to 200 mrad, therefore has a local intensity which strongly depends on composition, but depends less strongly on structure or precise orientation.

Hence thermionic emitters are not suitable for use with high energy resolution EEL spectrometry for example, where we require the energy resolution to be ca. 3 eV. If a large total beam current is a high priority, for EDX analysis, for example, one alternative is the use of a LaB6 pointed cathode, which is heated indirectly. This has the advantage of a factor of times 10 increase in beam brightness and beam current, with a slightly reduced energy spread. 5 eV with a high beam coherence, a cold field emission tip is usually required.

A weak phase object is a specimen so thin that the electron beam passing thorough it only suffers a modest phase shift, while its amplitude remains effectively unchanged. The approximation that a specimen is indeed a weak phase object is important for much of the treatment in Chapter 5. It should be obvious that such a specimen must be substantially thinner than the mean free path for all the inelastic scattering processes. In practice many biological specimens will meet this criterion at thicknesses below 50 nm, but specimens containing substantially heavier atoms would need to be much thinner.

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Aberration-corrected Analytical Electron Microscopy by Rik Brydson

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